The Fast Clear Transfers, Patterns test loads nine different patterns into the TEC LinMems. These patterns contain typical digital testing bit masks: AA,55,FF, etc. The patterns used are specified in two arrays of matrices in the file:
ADDER_TEST$LIBRARY:FAST_CLEAR_PATTERNS.H
The EMC and HAC values are specified in separate pattern arrays from the header file, but are loaded simultaneously in the pattern test. Each pattern is tested with 5 repetitions in each of the two TEC modes.