This section explains details of each Adder test and how to interpret error messages that may arise. For more details on the internal function of the Adders, see references [3] and [1] or [2].
Note the distinction between tests 0 through 5 and 6 through 23. Tests 0...5 only operate on individual Adders and test the read and write capability of the VME registers and memories. The latter group tests the data processing capabilities of the Adders, in tandem with each other and the rest of the CFLT crate and the associated CFLTP and Fast Clear Input Cards.